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Micro X-ray fluorescence (µ-XRF) Bruker M4 Tornado

Instrument

Micro X-ray fluorescence spectrometry (µXRF) is a fast, sensitive and non-destructive elemental analysis method for identifying and mapping chemical elements for an array of sample type, including inhomogeneous or irregularly sized specimens. Micro X-ray Fluorescence uses direct X-ray excitation to induce characteristic X-ray fluorescence emission with energy unique to each element of the periodic table providing reliable elemental identification. The instrument uses simple and efficient X-ray optics to restrict the excitation beam to a small spot on the sample surface allowing precise analysis. Owing to its high spatial resolution and little to no sample preparation, µXRF enables fast analyses with high-resolution of large and small samples, and can maps an area of up to 15 cm, with a 25 µm step size which provides rapid screening of trace level elements. MicroXRF is widely used in a wide range of research fields, including geology, metallurgy, materials science and biotechnology to name a few.

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Bruker M4 Tornado

Rates

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Applications​

Rutile is a source of titanium, particularly for the production of products such as titanium dioxide pigments (TiO2) and titanium (metal). It is a common mineral found in copper porphyry, and its TiO2 content is generally high (95%), the remainder being made up of several other metals, including Fe, Cr, V, Sn, Nb and Ta. Due to its morphology and geochemistry, rutile are recognized as a potential indicator mineral for exploration.

In this publication, Geochemistry of hydrothermal and stream sedimentary rutile in the Tiegelongnan porphyry-epithermal Cu (Au) deposit, Tibet: A tool for exploration (Yang et al., Ore Geology Reviews, 2024, 167, 105970), the researchers used the electron microprobe microanalyzer (EPMA) to characterize the physical properties and chemical composition of hydrothermal rutile and data proved the capability of using rutile as a proxy mineral for the exploration of porphyry copper deposits.



Contact

Contact

Enzo Caraballo Rojas, PhD 


418 656-2131 poste 405035

microlabmicroxrf@fsg.ulaval.ca

Professor


Prof. Carl Guilmette, PhD. Eng.


carl.guilmette@ggl.ulaval.ca
carl.guilmette.1@ulaval.ca

Booking

Available soon

Sample preparation

No sample preparation required for any sample types (solids, powders, and liquids. The ideal sample for XRF analysis should have a perfectly flat surface since irregular sample surfaces change the distance from the sample to the x-ray source and introduce error.

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