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Micro X-ray fluorescence (µ-XRF) Bruker M4 Tornado
In situ elemental mapping
The Bruker M4 TORNADO X-ray microfluorescence spectrometer allows for the identification of chemical elements (Na-U) present in a sample and the visualization of their distribution on its surface. Its 20 µm focused X-ray beam enables spot analyses, profiling, and two-dimensional elemental mapping . The technique is rapid, non-destructive, and suitable for studying a wide variety of materials, with generally minimal preparation .
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Availability and contact
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User Fees
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Sample types
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Technique and applications
A micro-X-ray fluorescence (µXRF) spectrometer is designed to determine the elemental composition of solid, particulate or liquid materials and to visualize the spatial distribution of elements. The technique is based on local excitation of the sample by a focused X-ray beam. The emitted fluorescent photons are then analyzed by energy to produce spectra, profiles and two-dimensional elemental maps.
The system combines an X-ray source, polycapillary optics, a motorized XYZ stage, an optical microscope for positioning and one or more silicon drift detectors. The µXRF can achieve a beam size of less than 20 µm, depending on the energy and configuration, map areas of up to 190 × 160 mm, and record a full spectrum at each pixel in the form of a HyperMap.
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Technique and applications
Sample types
Formats and dimensions
Samples can be thin sections, polished sections, fragments, objects, or non-cohesive materials prepared on a suitable support. The instrument can accommodate samples up to 190 × 160 mm and 4 kg, subject to their geometry and positioning.
Surface condition
Polishing is not mandatory. However, a flat, clean, and even surface is recommended to maintain a constant distance and facilitate focusing. Irregular solids can be examined after verifying the accessibility of the area of interest.
Powders and non-cohesive materials
Soils, powders, ashes, and concentrates can be encapsulated in resin and then polished, or prepared according to a validated protocol. Homogeneous preparation reduces variations attributable to particle size, voids, and segregation.
Impact of preparation on quality and repeatability
Fluorescence intensity depends on both the composition and the source-sample-detector geometry. A curved, inclined, or rough surface locally alters the distance, angle of incidence, and path of the emitted X-rays; it can create artificial variations in a map and increase quantitative uncertainty. For powders, particle size distribution, compaction, and homogeneity influence absorption and representativeness. Stable geometry and identical sample preparation therefore improve comparability and repeatability, although the technique remains compatible with many minimally prepared objects.
COMPATIBLE SAMPLES
Sample types
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User Fees
MicroLab rates are set according to the type of user, the instrument usage mode and, depending on the service, the analysis time or the number of samples. Some services, particularly sample preparation, may be billed per sample, while instrument use and data processing are generally billed on an hourly or daily basis.
User Categories
Université Laval
This category includes users whose projects are funded, in whole or in part, by Université Laval, regardless of their faculty or affiliated unit. In particular, it includes undergraduate, master’s and doctoral students carrying out work as part of a research project supervised by a Université Laval professor or researcher.
Research / Public Funding
This category includes students, professors, researchers and professionals from other Canadian universities, CEGEPs or research centres, when the work is carried out as part of projects or within institutions funded primarily by public funds. These funds may come, for example, from government or para-governmental organizations, federal or provincial research programs, or other public funding sources.
Industry
This category applies to private companies and to work carried out in an industrial or commercial context.
Usage Modes
When several usage modes are offered for an instrument, rates distinguish between assisted and unassisted use.
Assisted
The instrument is operated by the lead operator or the technical manager, who is responsible for starting the analysis, changing samples when necessary and assisting the user through the various stages of the measurement. This mode is particularly suited to analyses requiring specific instrumental expertise and to occasional users.
Unassisted
After completing appropriate training, users can carry out their own analyses and, when necessary, change samples themselves. Use nevertheless remains under the supervision of the instrument manager. Initial training is billed according to the time required and includes both staff time and instrument use.
Unassisted use is restricted to Université Laval users and depends on the instrument, the type of analysis and the user's level of experience. For the conditions of access to this mode, please contact the manager of the relevant instrument.
Pricing Based on Analysis Duration
For services with hourly and daily rates, billing is based on the total instrument usage time, including the time required to prepare and configure the instrument for the analysis.
For periods under 6 hours, the hourly rate applies. From 6 hours up to 24 hours, a daily flat rate applies. Beyond 24 hours, billing continues in daily increments at the applicable daily rate.
The daily flat rate is particularly advantageous for long analyses: its cost generally corresponds to that of six hours of use, while allowing the instrument to be used for up to 24 hours. It thus prevents costs from rising continuously during extended acquisitions and makes it easier to budget for an analysis session. For example, an analysis lasting 12, 18 or 24 hours is billed at the same daily flat rate rather than as the sum of the individual hours.
Services listed “per sample” are billed according to the number of samples processed, regardless of this hourly/daily structure.