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Scanning electron microscope (SEM) FEI Inspect F50
High-resolution morphological and textural analysis
The FEI Inspect F50 field emission scanning electron microscope allows the study of the morphology, texture, microstructure, and composition of materials down to the nanoscale, with magnifications up to 300,000X . The instrument acquires secondary electron (SE) images to observe surface topography, backscattered electron (BSE) images to distinguish phases according to their average composition, and cathodoluminescence (CL) images to reveal certain internal structures and growth variations. X-ray energy-dispersive spectrometry ( EDS ) also enables the identification of elements present and the performance of spot analyses.
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Availability and contact
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User Fees
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Sample types
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Technique and applications
The scanning electron microscope (SEM) makes it possible to characterize materials at the micro- and nanoscale by analyzing the various signals produced by the interaction between a focused electron beam and the sample. Its operation relies on an instrumental chain that includes generating and focusing the beam, scanning it across the surface of the material, and then detecting the electrons, X-rays and photons produced.
Each signal provides complementary information: secondary electrons mainly reveal surface topography and morphology, backscattered electrons highlight compositional contrast, characteristic X-rays enable elemental identification and microanalysis by EDS, and cathodoluminescence provides information on certain crystal defects, activator centres and optoelectronic properties. The following sections describe the main components of the instrument and the physical phenomena underlying these different modes of analysis.
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Technique and applications
Sample types
Formats and mounting
Samples may be thin sections, polished sections, fragments, cuts, filters, or particles. They must be dry, stable under vacuum, and securely fixed to a conductive support. Powders are usually deposited onto conductive carbon tape; all loose particles must be removed.
Preparation according to the objective
For quantitative or comparative EDS, a flat, mirror-polished surface is recommended to reduce relief effects. For imaging topography, texture, or natural morphology, polishing can destroy information and should be avoided.
Conductive coating — services offered by MicroLab
Non-conductive materials often require metallization to dissipate the charges accumulated under the beam. MicroLab offers coating services tailored to SEM: carbon deposition, primarily recommended for EDS, and metallic deposition of Au-Pd, Pt-Pd, Cr, or Ag, mainly intended for high-resolution imaging. The choice of material and thickness depends on the nature of the sample, the desired magnification, and the elements being studied. A metallic coating can enhance the secondary electron signal, but it introduces its own X-ray lines and can obscure details if the coating is too thick.
Health and safety
The presence of crystalline silica, nanoparticles, respirable fibers, biological materials, toxic substances, or any other hazard must be declared before preparation. This information determines the handling method and the admissibility of the sample.
Impact of preparation on quality and repeatability
A non-conductive sample without a coating can accumulate electrons. This charge deflects the beam, resulting in drift, streaking, overexposed areas, loss of contrast, and analytical instability. A conductive coating, properly bonded to the sample holder, dissipates the charge and improves sharpness and repeatability. For EDS, carbon is generally preferred because a coating metal can generate additional peaks and absorb some X-rays. For very high-resolution imaging, a fine-grained metal can improve secondary electron yield. However, sample preparation must preserve the phenomenon being studied: polishing, aggressive cleaning, or an excessively thick film can alter the actual topography. MicroLab's coating service allows for the selection and application of the coating based on the analytical objective.
COMPATIBLE SAMPLES
Sample types
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User Fees
MicroLab rates are set according to the type of user, the instrument usage mode and, depending on the service, the analysis time or the number of samples. Some services, particularly sample preparation, may be billed per sample, while instrument use and data processing are generally billed on an hourly or daily basis.
User Categories
Université Laval
This category includes users whose projects are funded, in whole or in part, by Université Laval, regardless of their faculty or affiliated unit. In particular, it includes undergraduate, master’s and doctoral students carrying out work as part of a research project supervised by a Université Laval professor or researcher.
Research / Public Funding
This category includes students, professors, researchers and professionals from other Canadian universities, CEGEPs or research centres, when the work is carried out as part of projects or within institutions funded primarily by public funds. These funds may come, for example, from government or para-governmental organizations, federal or provincial research programs, or other public funding sources.
Industry
This category applies to private companies and to work carried out in an industrial or commercial context.
Usage Modes
When several usage modes are offered for an instrument, rates distinguish between assisted and unassisted use.
Assisted
The instrument is operated by the lead operator or the technical manager, who is responsible for starting the analysis, changing samples when necessary and assisting the user through the various stages of the measurement. This mode is particularly suited to analyses requiring specific instrumental expertise and to occasional users.
Unassisted
After completing appropriate training, users can carry out their own analyses and, when necessary, change samples themselves. Use nevertheless remains under the supervision of the instrument manager. Initial training is billed according to the time required and includes both staff time and instrument use.
Unassisted use is restricted to Université Laval users and depends on the instrument, the type of analysis and the user's level of experience. For the conditions of access to this mode, please contact the manager of the relevant instrument.
Pricing Based on Analysis Duration
For services with hourly and daily rates, billing is based on the total instrument usage time, including the time required to prepare and configure the instrument for the analysis.
For periods under 6 hours, the hourly rate applies. From 6 hours up to 24 hours, a daily flat rate applies. Beyond 24 hours, billing continues in daily increments at the applicable daily rate.
The daily flat rate is particularly advantageous for long analyses: its cost generally corresponds to that of six hours of use, while allowing the instrument to be used for up to 24 hours. For example, an analysis lasting 12, 18 or 24 hours is billed at the same daily flat rate rather than as the sum of the individual hours.
Services listed “per sample” are billed according to the number of samples processed, regardless of this hourly/daily structure.