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Laser Ablation Inductively-Coupled Plasma Mass Spectrometry (LA-ICPMS) Agilent 8900 Triple Quadrupole
Electron probe micro-analyzer (EPMA) CAMECA SX-100
Scanning electron microscope (SEM) FEI Inspect F50
Micro X-ray fluorescence (µ-XRF) Bruker M4 Tornado
Handheld/portable X-ray fluorescence (p-XRF) Bruker Tracer IIISD
X-ray Diffractometer (XRD) Malvern Panalytical Empyrean
X-ray photoelectron spectroscopy (XPS) KRATOS Analytical AxisUltra
Laser Ablation Inductively-Coupled Plasma Mass Spectrometry (LA-ICPMS) Agilent 8900 Triple Quadrupole
Electron probe micro-analyzer (EPMA) CAMECA SX-100
Scanning electron microscope (SEM) FEI Inspect F50
Micro X-ray fluorescence (µ-XRF) Bruker M4 Tornado
Handheld/portable X-ray fluorescence (p-XRF) Bruker Tracer IIISD
X-ray Diffractometer (XRD) Malvern Panalytical Empyrean
X-ray photoelectron spectroscopy (XPS) KRATOS Analytical AxisUltra
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MicroLab

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